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A revolutionary breakthrough in high-performance QFN testing
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IDI has developed an innovative and robust contact technology for making Kelvin contact to 0.5mm pitch QFNs. The contact uses a tip that is angled to one side, matched to an orientation that’s fl at on the tip. Two such contacts placed in opposition will touch the pad within 0.125mm. And because the tip is offset, the probe diameter is a robust 0.39mm and the load board pad pitch remains 0.5mm. Plus, the Offset Kelvin contact is uniquely suited to a production environment because of its long life, ease of maintenance and tolerance for device misalignment. |
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