For more information on PoP sockets or any of our other products, call us at (913) 342-5544.

A Revolutionary Approach to PoP Test Sockets
For over 2 years, IDI’s Antares PoP test sockets have been providing reliable solutions for both manual and automatic testing of package on package devices.
The unique ability of our PoP test socket to accurately and simultaneously align both the upper and lower device pads increases fault coverage and lowers the cost of test.

Three Basic Designs of PoP Sockets
• Memory-Less (ML) PoP Socket –
top and bottom access to
leads on devices with memory
information supplied from the
tester thru the socket assembly.

• Memory-Bearing (MB) PoP Socket –
top and bottom access to leads on devices with a known good memory device contained within the socket
assembly providing a temporary
connection to the PoP device test.

• Manual Test (MT) PoP Socket –
top and bottom access to leads on devices with a known good memory device contained within the lid assembly providing a temporary connection to the
PoP device test.

Pop Test Sockets
• Proven design – over 2 years in the field
• Reliable alignment to the bottom and top side leads
• Superior Signal Integrity to both packages
• Interface bandwidths to 10 GHz
• 0.40mm pitch & above – production ready solutions
• 0.25mm pitch – in development